Determine an estimate of the number of good chips

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Reference no: EM131255557

A silicon wafer with a diameter of 200 mm is processed over a circular area whose diameter = 190 mm. The chips to be fabricated are square with 10 mm on a side. The density of point defects in the surface area is 0.0047 defects/cm² . Determine an estimate of the number of good chips using the Bose-Einstein yield computation.

Reference no: EM131255557

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